Electrical properties of thin yttria-stabilized zirconia overlayers produced by atomic layer deposition for solid oxide fuel cell applicationsBRAHIM, C; RINGUEDE, A; CASSIR, M et al.Applied surface science. 2007, Vol 253, Num 8, pp 3962-3968, issn 0169-4332, 7 p.Article

Surface modification of platinum by titanium dioxide overlayers: abstractDWYER, D. J; CAMERON, S. D; GLAND, J. L et al.Preprints - American Chemical Society. Division of Petroleum Chemistry. 1985, Vol 30, Num 1, issn 0569-3799, 136Article

Electroluminescence from deuterium terminated porous siliconMATSUMOTO, T; MASUMOTO, Y; NAKAGAWA, T et al.Japanese journal of applied physics. 1997, Vol 36, Num 8B, pp L1089-L1091, issn 0021-4922, 2Article

Force measurements on hydrophobized silica surfaces by using AFMHÜTTL, G; HEGER, K; KLEMM, V et al.Fresenius' journal of analytical chemistry. 1999, Vol 363, Num 2, pp 206-208, issn 0937-0633Article

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Experimental confirmation of the EPES sampling depth paradox for overlayer/substrate systemsVOS, M; WENT, M. R.Surface science. 2007, Vol 601, Num 6, pp 1536-1543, issn 0039-6028, 8 p.Article

Quantum stability of ultrathin metal overlayers on semiconductor substratesZHENYU ZHANG.Surface science. 2004, Vol 571, Num 1-3, pp 1-4, issn 0039-6028, 4 p.Article

Next generation ceramic multilayer systemsBACHER, R. J; WANG, Y. L; SKURSKI, M. A et al.SPIE proceedings series. 2000, pp 202-207, isbn 0-930815-62-9Conference Paper

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Charge correction of the binding energy scale in XPS analysis of polymers using surface deposition of PDMSBURRELL, M. C; CHERA, J. J.Surface and interface analysis. 1999, Vol 27, Num 9, pp 811-815, issn 0142-2421Article

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Twenty years of semiconductor surface and interface structure determination and prediction : the role of the annual conferences on the physics and chemistry of semiconductor interfacesDUKE, C. B.Journal of vacuum science & technology. B. Microelectronics and nanometer structures. Processing, measurement and phenomena. 1993, Vol 11, Num 4, pp 1336-1346, issn 1071-1023Conference Paper

Charge dissipation on chemically treated thin silicon oxide in airUCHIHASHI, T; NAKANO, A; IDA, T et al.Japanese journal of applied physics. 1997, Vol 36, Num 6A, pp 3755-3758, issn 0021-4922, 1Article

Transient heat transfer in coated diathermic media : a theoretical studyHAHN, O; HOFMANN, R; MEHLING, H et al.High Temperatures. High Pressures (Print). 1997, Vol 29, Num 6, pp 693-701, issn 0018-1544Article

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LEED and XPS studies of ZrO/W(100) surface in comparison with W(110) surfaceKAWATA, S; TAHARA, S; SATOH, H et al.Applied surface science. 1997, Vol 111, pp 96-98, issn 0169-4332Conference Paper

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Calculation of surface states using a one-dimensional scattering modelFAUSTER, TH.Applied physics. A, Solids and surfaces. 1994, Vol 59, Num 6, pp 639-643, issn 0721-7250Article

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Low-energy (<10 eV) O+ ions transmission through alkali-metal submonolayersDAVYDOV, S. Y.Surface science. 1998, Vol 408, Num 1-3, pp 21-27, issn 0039-6028Article

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